Electromagnetic Emission Scanning at the Surface of ICs

Bernd Deutschmann, Andreas Gleinser, Philipp Reitter

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Abstract

With increasing density of components in modern ICs, their electromagnetic compatibility (EMC) becomes more and more a design factor to consider. A lot of interference problems of electronic systems originate form high electromagnetic emission and low immunity of the used ICs. The so-called surface scan method provides a useful measurement technique to highlight origins of emissions
directly at the surface of IC packages or microchips. It is based on measuring electric- as well as magnetic near fields at the surface of ICs by automatically
moving a probe in 3 axis over the device. This technique enables the visualization of the distribution of E- and Hfields emitting from the surface of the device and thereby helps to identify and analyze emission hotspots.
LanguageEnglish
Title of host publication15. EMV-Fachtagung
Subtitle of host publicationOVE Schriftenreihe Nr. 87
EditorsGunter Winkler
Place of PublicationWien
PublisherÖsterreichischer Verband für Elektrotechnik
Pages16
Number of pages1
Volume87
ISBN (Print)3-85133-093-5
StatusPublished - 26 Apr 2017

Fingerprint

Scanning
Electromagnetic compatibility
Visualization

Keywords

  • EMC, Surface Scan, Emission, IC

ASJC Scopus subject areas

  • Engineering(all)

Fields of Expertise

  • Information, Communication & Computing

Cite this

Deutschmann, B., Gleinser, A., & Reitter, P. (2017). Electromagnetic Emission Scanning at the Surface of ICs. In G. Winkler (Ed.), 15. EMV-Fachtagung: OVE Schriftenreihe Nr. 87 (Vol. 87, pp. 16). Wien: Österreichischer Verband für Elektrotechnik.

Electromagnetic Emission Scanning at the Surface of ICs. / Deutschmann, Bernd; Gleinser, Andreas; Reitter, Philipp.

15. EMV-Fachtagung: OVE Schriftenreihe Nr. 87. ed. / Gunter Winkler. Vol. 87 Wien : Österreichischer Verband für Elektrotechnik, 2017. p. 16.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Deutschmann, B, Gleinser, A & Reitter, P 2017, Electromagnetic Emission Scanning at the Surface of ICs. in G Winkler (ed.), 15. EMV-Fachtagung: OVE Schriftenreihe Nr. 87. vol. 87, Österreichischer Verband für Elektrotechnik, Wien, pp. 16.
Deutschmann B, Gleinser A, Reitter P. Electromagnetic Emission Scanning at the Surface of ICs. In Winkler G, editor, 15. EMV-Fachtagung: OVE Schriftenreihe Nr. 87. Vol. 87. Wien: Österreichischer Verband für Elektrotechnik. 2017. p. 16.
Deutschmann, Bernd ; Gleinser, Andreas ; Reitter, Philipp. / Electromagnetic Emission Scanning at the Surface of ICs. 15. EMV-Fachtagung: OVE Schriftenreihe Nr. 87. editor / Gunter Winkler. Vol. 87 Wien : Österreichischer Verband für Elektrotechnik, 2017. pp. 16
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