Electrical Capacitance Tomography using Bayesian Inference

Colin Fox, Daniel Watzenig

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationElectronics New Zealand Conference
Publisher.
Pages13-18
Publication statusPublished - 2008
EventElectronics New Zealand Conference - Auckland, New Zealand
Duration: 24 Nov 200825 Nov 2008

Conference

ConferenceElectronics New Zealand Conference
CountryNew Zealand
CityAuckland
Period24/11/0825/11/08

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

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