Electrical Capacitance Tomography using Bayesian Inference

Colin Fox, Daniel Watzenig

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationElectronics New Zealand Conference
Publisher.
Pages13-18
Publication statusPublished - 2008
EventElectronics New Zealand Conference - Auckland, New Zealand
Duration: 24 Nov 200825 Nov 2008

Conference

ConferenceElectronics New Zealand Conference
CountryNew Zealand
CityAuckland
Period24/11/0825/11/08

Treatment code (Nähere Zuordnung)

  • Application
  • Experimental

Cite this

Fox, C., & Watzenig, D. (2008). Electrical Capacitance Tomography using Bayesian Inference. In Electronics New Zealand Conference (pp. 13-18). ..

Electrical Capacitance Tomography using Bayesian Inference. / Fox, Colin; Watzenig, Daniel.

Electronics New Zealand Conference. ., 2008. p. 13-18.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Fox, C & Watzenig, D 2008, Electrical Capacitance Tomography using Bayesian Inference. in Electronics New Zealand Conference. ., pp. 13-18, Electronics New Zealand Conference, Auckland, New Zealand, 24/11/08.
Fox C, Watzenig D. Electrical Capacitance Tomography using Bayesian Inference. In Electronics New Zealand Conference. . 2008. p. 13-18
Fox, Colin ; Watzenig, Daniel. / Electrical Capacitance Tomography using Bayesian Inference. Electronics New Zealand Conference. ., 2008. pp. 13-18
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