EFTEM at high magnification: Principles and practical applications

Werner Grogger*, Kannan M. Krishnan, Ferdinand Hofer

*Corresponding author for this work

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)72-73
Number of pages2
JournalMicroscopy and microanalysis
Volume8
Issue numberSUPPL. 2
Publication statusPublished - 20 Nov 2002

ASJC Scopus subject areas

  • Instrumentation

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