EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

Boriana Raskova, Saso Sturm, Z. Zhang, Gerald Kothleitner, Kerstin Kutschej, Christian Mitterer, Petr Lazar, Josef Redinger, Raimund Poldloucky, Christina Scheu, Gerhard Dehm

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationMaterials Science
Place of PublicationWien
PublisherFacultas
Pages285-286
ISBN (Print)978-3-85125-062-6
DOIs
Publication statusPublished - 2009
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Projects

Nanoanalysis using transmission electron microscopy

1/01/04 → …

Project: Research area

Cite this

Raskova, B., Sturm, S., Zhang, Z., Kothleitner, G., Kutschej, K., Mitterer, C., ... Dehm, G. (2009). EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. In Materials Science (pp. 285-286). Wien: Facultas. https://doi.org/10.3217/978-3-85125-062-6-515