EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates

Boriana Raskova, Saso Sturm, Z. Zhang, Gerald Kothleitner, Kerstin Kutschej, Christian Mitterer, Petr Lazar, Josef Redinger, Raimund Poldloucky, Christina Scheu, Gerhard Dehm

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMaterials Science
Place of PublicationWien
PublisherFacultas
Pages285-286
ISBN (Print)978-3-85125-062-6
DOIs
Publication statusPublished - 2009
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Raskova, B., Sturm, S., Zhang, Z., Kothleitner, G., Kutschej, K., Mitterer, C., ... Dehm, G. (2009). EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. In Materials Science (pp. 285-286). Wien: Facultas. https://doi.org/10.3217/978-3-85125-062-6-515

EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. / Raskova, Boriana; Sturm, Saso; Zhang, Z.; Kothleitner, Gerald; Kutschej, Kerstin; Mitterer, Christian; Lazar, Petr; Redinger, Josef; Poldloucky, Raimund; Scheu, Christina; Dehm, Gerhard.

Materials Science. Wien : Facultas, 2009. p. 285-286.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Raskova, B, Sturm, S, Zhang, Z, Kothleitner, G, Kutschej, K, Mitterer, C, Lazar, P, Redinger, J, Poldloucky, R, Scheu, C & Dehm, G 2009, EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. in Materials Science. Facultas, Wien, pp. 285-286, Multinational Congress on Microscopy, Graz, Austria, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-515
Raskova B, Sturm S, Zhang Z, Kothleitner G, Kutschej K, Mitterer C et al. EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. In Materials Science. Wien: Facultas. 2009. p. 285-286 https://doi.org/10.3217/978-3-85125-062-6-515
Raskova, Boriana ; Sturm, Saso ; Zhang, Z. ; Kothleitner, Gerald ; Kutschej, Kerstin ; Mitterer, Christian ; Lazar, Petr ; Redinger, Josef ; Poldloucky, Raimund ; Scheu, Christina ; Dehm, Gerhard. / EELS Measurements and Ab-initio Calculations of the N-K Edge in TiN/VN Films Desposted on MgO Substrates. Materials Science. Wien : Facultas, 2009. pp. 285-286
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AU - Kothleitner, Gerald

AU - Kutschej, Kerstin

AU - Mitterer, Christian

AU - Lazar, Petr

AU - Redinger, Josef

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AU - Scheu, Christina

AU - Dehm, Gerhard

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PB - Facultas

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