EELS and EDX spectroscopy for the quantitative analysis of hard metals

Lukas Konrad, Martina Lattemann, Kevin Jorissen, John Rehr, Johanna Kraxner, Daniel Knez, Angelina Orthacker, Werner Grogger, Gerald Kothleitner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
PagesPO-273-280-282
Publication statusPublished - 2015
EventMultinational Congress on Microscopy - Eger, Hungary
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMultinational Congress on Microscopy
CountryHungary
CityEger
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Konrad, L., Lattemann, M., Jorissen, K., Rehr, J., Kraxner, J., Knez, D., ... Kothleitner, G. (2015). EELS and EDX spectroscopy for the quantitative analysis of hard metals. In Multinational Congress on Microscopy (pp. PO-273-280-282). ..

EELS and EDX spectroscopy for the quantitative analysis of hard metals. / Konrad, Lukas; Lattemann, Martina; Jorissen, Kevin; Rehr, John; Kraxner, Johanna; Knez, Daniel; Orthacker, Angelina; Grogger, Werner; Kothleitner, Gerald.

Multinational Congress on Microscopy. ., 2015. p. PO-273-280-282.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Konrad, L, Lattemann, M, Jorissen, K, Rehr, J, Kraxner, J, Knez, D, Orthacker, A, Grogger, W & Kothleitner, G 2015, EELS and EDX spectroscopy for the quantitative analysis of hard metals. in Multinational Congress on Microscopy. ., pp. PO-273-280-282, Multinational Congress on Microscopy, Eger, Hungary, 23/08/15.
Konrad L, Lattemann M, Jorissen K, Rehr J, Kraxner J, Knez D et al. EELS and EDX spectroscopy for the quantitative analysis of hard metals. In Multinational Congress on Microscopy. . 2015. p. PO-273-280-282
Konrad, Lukas ; Lattemann, Martina ; Jorissen, Kevin ; Rehr, John ; Kraxner, Johanna ; Knez, Daniel ; Orthacker, Angelina ; Grogger, Werner ; Kothleitner, Gerald. / EELS and EDX spectroscopy for the quantitative analysis of hard metals. Multinational Congress on Microscopy. ., 2015. pp. PO-273-280-282
@inproceedings{9c687834256e4851a5977fc6bd3c9fce,
title = "EELS and EDX spectroscopy for the quantitative analysis of hard metals",
author = "Lukas Konrad and Martina Lattemann and Kevin Jorissen and John Rehr and Johanna Kraxner and Daniel Knez and Angelina Orthacker and Werner Grogger and Gerald Kothleitner",
year = "2015",
language = "English",
pages = "PO--273--280--282",
booktitle = "Multinational Congress on Microscopy",
publisher = ".",

}

TY - GEN

T1 - EELS and EDX spectroscopy for the quantitative analysis of hard metals

AU - Konrad, Lukas

AU - Lattemann, Martina

AU - Jorissen, Kevin

AU - Rehr, John

AU - Kraxner, Johanna

AU - Knez, Daniel

AU - Orthacker, Angelina

AU - Grogger, Werner

AU - Kothleitner, Gerald

PY - 2015

Y1 - 2015

M3 - Conference contribution

SP - PO-273-280-282

BT - Multinational Congress on Microscopy

PB - .

ER -