EELS and EDX spectroscopy for the quantitative analysis of hard metals

Lukas Konrad, Martina Lattemann, Kevin Jorissen, John Rehr, Johanna Kraxner, Daniel Knez, Angelina Orthacker, Werner Grogger, Gerald Kothleitner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
PagesPO-273-280-282
Publication statusPublished - 2015
EventMultinational Congress on Microscopy - Eger, Hungary
Duration: 23 Aug 201528 Aug 2015

Conference

ConferenceMultinational Congress on Microscopy
CountryHungary
CityEger
Period23/08/1528/08/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Konrad, L., Lattemann, M., Jorissen, K., Rehr, J., Kraxner, J., Knez, D., ... Kothleitner, G. (2015). EELS and EDX spectroscopy for the quantitative analysis of hard metals. In Multinational Congress on Microscopy (pp. PO-273-280-282). ..