EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals

Lukas Konrad, Martina Lattemann, Johanna Kraxner, Daniel Knez, Angelina Orthacker, Werner Grogger, Gerald Kothleitner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationASEM Workshop Advanced Electron Microscopy
Publisher.
Pages19-19
Publication statusPublished - 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Konrad, L., Lattemann, M., Kraxner, J., Knez, D., Orthacker, A., Grogger, W., & Kothleitner, G. (2015). EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. In ASEM Workshop Advanced Electron Microscopy (pp. 19-19). ..