EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals

Lukas Konrad, Martina Lattemann, Johanna Kraxner, Daniel Knez, Angelina Orthacker, Werner Grogger, Gerald Kothleitner

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationASEM Workshop Advanced Electron Microscopy
Publisher.
Pages19-19
Publication statusPublished - 2015
Event5th ASEM Workshop - Graz, Austria
Duration: 7 Jun 20158 Jun 2015

Conference

Conference5th ASEM Workshop
CountryAustria
CityGraz
Period7/06/158/06/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

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Cite this

Konrad, L., Lattemann, M., Kraxner, J., Knez, D., Orthacker, A., Grogger, W., & Kothleitner, G. (2015). EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. In ASEM Workshop Advanced Electron Microscopy (pp. 19-19). ..

EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. / Konrad, Lukas; Lattemann, Martina; Kraxner, Johanna; Knez, Daniel; Orthacker, Angelina; Grogger, Werner; Kothleitner, Gerald.

ASEM Workshop Advanced Electron Microscopy. ., 2015. p. 19-19.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Konrad, L, Lattemann, M, Kraxner, J, Knez, D, Orthacker, A, Grogger, W & Kothleitner, G 2015, EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. in ASEM Workshop Advanced Electron Microscopy. ., pp. 19-19, 5th ASEM Workshop, Graz, Austria, 7/06/15.
Konrad L, Lattemann M, Kraxner J, Knez D, Orthacker A, Grogger W et al. EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. In ASEM Workshop Advanced Electron Microscopy. . 2015. p. 19-19
Konrad, Lukas ; Lattemann, Martina ; Kraxner, Johanna ; Knez, Daniel ; Orthacker, Angelina ; Grogger, Werner ; Kothleitner, Gerald. / EEL and EDX spectroscopic sensitivity factors for the quantitative analysis of hard metals. ASEM Workshop Advanced Electron Microscopy. ., 2015. pp. 19-19
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AU - Konrad, Lukas

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AU - Kraxner, Johanna

AU - Knez, Daniel

AU - Orthacker, Angelina

AU - Grogger, Werner

AU - Kothleitner, Gerald

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