EDX and EELS Chemical Analysis with a Probe Corrected STEM

Gerald Kothleitner, Stefanie Fladischer, Werner Grogger, Thomas Haber, Arno Meingast, Ferdinand Hofer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis
Publisher.
Pages972-973
DOIs
Publication statusPublished - 2012
EventMicroscopy and Microanalysis - Phoenix, Arizona, United States
Duration: 30 Jul 20123 Aug 2012

Conference

ConferenceMicroscopy and Microanalysis
CountryUnited States
CityPhoenix, Arizona
Period30/07/123/08/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Kothleitner, G., Fladischer, S., Grogger, W., Haber, T., Meingast, A., & Hofer, F. (2012). EDX and EELS Chemical Analysis with a Probe Corrected STEM. In Microscopy and Microanalysis (pp. 972-973). .. https://doi.org/10.1017/S143192761200671X

EDX and EELS Chemical Analysis with a Probe Corrected STEM. / Kothleitner, Gerald; Fladischer, Stefanie; Grogger, Werner; Haber, Thomas; Meingast, Arno; Hofer, Ferdinand.

Microscopy and Microanalysis. ., 2012. p. 972-973.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Kothleitner, G, Fladischer, S, Grogger, W, Haber, T, Meingast, A & Hofer, F 2012, EDX and EELS Chemical Analysis with a Probe Corrected STEM. in Microscopy and Microanalysis. ., pp. 972-973, Microscopy and Microanalysis, Phoenix, Arizona, United States, 30/07/12. https://doi.org/10.1017/S143192761200671X
Kothleitner G, Fladischer S, Grogger W, Haber T, Meingast A, Hofer F. EDX and EELS Chemical Analysis with a Probe Corrected STEM. In Microscopy and Microanalysis. . 2012. p. 972-973 https://doi.org/10.1017/S143192761200671X
Kothleitner, Gerald ; Fladischer, Stefanie ; Grogger, Werner ; Haber, Thomas ; Meingast, Arno ; Hofer, Ferdinand. / EDX and EELS Chemical Analysis with a Probe Corrected STEM. Microscopy and Microanalysis. ., 2012. pp. 972-973
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