DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization

Julian Wagner, Miroslava Schaffer, Hartmuth Schröttner, Stefan Mitsche, Ilse Letofsky-Papst, Ch. Stotter, Christof Sommitsch

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Microscopy Congress
Place of PublicationBerlin
PublisherSpringer
Pages687-688
VolumeVolume1
ISBN (Print)978-3-540-85154-7
Publication statusPublished - 2008
EventEuropean Microscopy Congress - Aachen, Germany
Duration: 1 Sep 20085 Sep 2008

Publication series

NameInstrumentation and Methods
PublisherSpringer

Conference

ConferenceEuropean Microscopy Congress
CountryGermany
CityAachen
Period1/09/085/09/08

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Wagner, J., Schaffer, M., Schröttner, H., Mitsche, S., Letofsky-Papst, I., Stotter, C., & Sommitsch, C. (2008). DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization. In European Microscopy Congress (Vol. Volume1, pp. 687-688). (Instrumentation and Methods). Berlin: Springer.

DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization. / Wagner, Julian; Schaffer, Miroslava; Schröttner, Hartmuth; Mitsche, Stefan; Letofsky-Papst, Ilse; Stotter, Ch.; Sommitsch, Christof.

European Microscopy Congress. Vol. Volume1 Berlin : Springer, 2008. p. 687-688 (Instrumentation and Methods).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Wagner, J, Schaffer, M, Schröttner, H, Mitsche, S, Letofsky-Papst, I, Stotter, C & Sommitsch, C 2008, DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization. in European Microscopy Congress. vol. Volume1, Instrumentation and Methods, Springer, Berlin, pp. 687-688, European Microscopy Congress, Aachen, Germany, 1/09/08.
Wagner J, Schaffer M, Schröttner H, Mitsche S, Letofsky-Papst I, Stotter C et al. DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization. In European Microscopy Congress. Vol. Volume1. Berlin: Springer. 2008. p. 687-688. (Instrumentation and Methods).
Wagner, Julian ; Schaffer, Miroslava ; Schröttner, Hartmuth ; Mitsche, Stefan ; Letofsky-Papst, Ilse ; Stotter, Ch. ; Sommitsch, Christof. / DualBeam FIB application of 3D EDXS for superalloy δ-phase characterization. European Microscopy Congress. Vol. Volume1 Berlin : Springer, 2008. pp. 687-688 (Instrumentation and Methods).
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