DualBeam and analytical electron microscopy - applications in materials science

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 24 Apr 2006
Event2nd FEI FIB & DualBeam Userclub Meeting - Eindhoven, Netherlands
Duration: 24 Apr 200626 Apr 2006

Conference

Conference2nd FEI FIB & DualBeam Userclub Meeting
CountryNetherlands
CityEindhoven
Period24/04/0626/04/06

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Rogers, M., Kothleitner, G., & Schaffer, B. (2006). DualBeam and analytical electron microscopy - applications in materials science. 2nd FEI FIB & DualBeam Userclub Meeting, Eindhoven, Netherlands.