DualBeam and analytical electron microscopy - applications in materials science

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 24 Apr 2006
Event2nd FEI FIB & DualBeam Userclub Meeting - Eindhoven, Netherlands
Duration: 24 Apr 200626 Apr 2006

Conference

Conference2nd FEI FIB & DualBeam Userclub Meeting
Country/TerritoryNetherlands
CityEindhoven
Period24/04/0626/04/06

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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