| Original language | English |
|---|---|
| Title of host publication | The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication |
| Chapter | 2A5 |
| Number of pages | 2 |
| Publication status | Published - 30 May 2017 |
| Event | The 61st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication 2017 - Walt Disney World Coronado Springs Resort, Orlando, Florida, United States Duration: 30 May 2017 → 2 Jun 2017 |
Conference
| Conference | The 61st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication 2017 |
|---|---|
| Abbreviated title | EIPBN 2017 |
| Country | United States |
| City | Orlando, Florida |
| Period | 30/05/17 → 2/06/17 |
ASJC Scopus subject areas
- Materials Science(all)
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Application
Cite this
Sattelkow, J., Fröch, J., & Plank, H. (2017). Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever. In The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication
Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever. / Sattelkow, Jürgen; Fröch, Johannes; Plank, Harald.
The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication. 2017.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research
Sattelkow, J, Fröch, J & Plank, H 2017, Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever. in The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication. The 61st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication 2017, Orlando, Florida, United States, 30/05/17.
Sattelkow J, Fröch J, Plank H. Direct-Write Fabrication of Electric and Thermal High-Resolution Nano-Probes on Self-Sensing AFM Cantilever. In The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication. 2017
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PY - 2017/5/30
Y1 - 2017/5/30
M3 - Conference contribution
BT - The 61 st International Conference on Electron, Ion, and Photon Beam Technology, and Nanofabrication
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