Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances

Bernd Deutschmann, Timm Ostermann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Mixed-Signal Testing Workshop
Publisher.
Pages264-267
Publication statusPublished - 2003
EventInternational Mixed-Signal Testing Workshop - Seville, Spain
Duration: 25 Jun 200327 Jun 2003

Conference

ConferenceInternational Mixed-Signal Testing Workshop
CountrySpain
CitySeville
Period25/06/0327/06/03

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., & Ostermann, T. (2003). Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances. In International Mixed-Signal Testing Workshop (pp. 264-267). ..