Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Mixed-Signal Testing Workshop
Publisher	.
Pages	264-267
Publication status	Published - 2003
Event	International Mixed-Signal Testing Workshop - Seville, Spain Duration: 25 Jun 2003 → 27 Jun 2003

Conference	International Mixed-Signal Testing Workshop
Country/Territory	Spain
City	Seville
Period	25/06/03 → 27/06/03

Fields of Expertise

@inproceedings{70869cf10a314355b0d1a3f8348148f3,

title = "Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances",

author = "Bernd Deutschmann and Timm Ostermann",

year = "2003",

language = "English",

pages = "264--267",

booktitle = "International Mixed-Signal Testing Workshop",

publisher = ".",

note = "International Mixed-Signal Testing Workshop ; Conference date: 25-06-2003 Through 27-06-2003",

}

TY - GEN

T1 - Direct Power Injection (DPI) to Measure the Immunity of Integrated Circuits Against Conducted Disturbances

AU - Deutschmann, Bernd

AU - Ostermann, Timm

PY - 2003

Y1 - 2003

M3 - Conference paper

SP - 264

EP - 267

BT - International Mixed-Signal Testing Workshop

PB - .

T2 - International Mixed-Signal Testing Workshop

Y2 - 25 June 2003 through 27 June 2003

ER -