Abstract
Domain wall motion and lattice strain dynamics of ferroelectrics at resonance were simultaneously measured by combining high-power burst excitation and in situ high-energy x-ray diffraction. The increased loss at high vibration velocity was directly related to the increased domain wall motion, driven by dynamic mechanical stress. A general relationship between the microstructural strain contributions and macroscopic electromechanical behavior was established, allowing the prediction of high-power stability of ferroelectric materials. The results indicate that the materials' stability during high-power drive is predominantly related to the basic chemical composition, while the piezoelectric hardening mechanisms mainly influence the small-signal behavior.
Original language | English |
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Article number | 174113 |
Journal | Physical Review B |
Volume | 103 |
Issue number | 17 |
DOIs | |
Publication status | Published - 26 May 2021 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Fields of Expertise
- Advanced Materials Science