Development of a laser-speckle-based measurement principle for the evaluation of mechanical deformation of stacked metal sheets

Clemens Halder; Thomas Thurner; Mathias Mair

doi:10.1117/12.2052316

Development of a laser-speckle-based measurement principle for the evaluation of mechanical deformation of stacked metal sheets

Clemens Halder, Thomas Thurner, Mathias Mair

Institute of Mechanics (3050)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Optical Micro- and Nanometrology
Publisher	.
Pages	127-138
Volume	9132
ISBN (Print)	978-1-6284-1080-8
DOIs	https://doi.org/10.1117/12.2052316
Publication status	Published - 2014
Event	Optical Micro- and Nanometrology - Brussels, Belgium Duration: 14 Apr 2014 → 17 Apr 2014

Publication series

Name	Proceedings of SPIE

Conference

Conference	Optical Micro- and Nanometrology
Country/Territory	Belgium
City	Brussels
Period	14/04/14 → 17/04/14

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Application
Experimental

Access to Document

10.1117/12.2052316

Cite this

@inproceedings{457df094d06c4e1c845f4938351136c8,

title = "Development of a laser-speckle-based measurement principle for the evaluation of mechanical deformation of stacked metal sheets",

author = "Clemens Halder and Thomas Thurner and Mathias Mair",

year = "2014",

doi = "10.1117/12.2052316",

language = "English",

isbn = "978-1-6284-1080-8",

volume = "9132",

series = "Proceedings of SPIE",

publisher = ".",

pages = "127--138",

booktitle = "Optical Micro- and Nanometrology",

note = "Optical Micro- and Nanometrology ; Conference date: 14-04-2014 Through 17-04-2014",

}

TY - GEN

T1 - Development of a laser-speckle-based measurement principle for the evaluation of mechanical deformation of stacked metal sheets

AU - Halder, Clemens

AU - Thurner, Thomas

AU - Mair, Mathias

PY - 2014

Y1 - 2014

U2 - 10.1117/12.2052316

DO - 10.1117/12.2052316

M3 - Conference paper

SN - 978-1-6284-1080-8

VL - 9132

T3 - Proceedings of SPIE

SP - 127

EP - 138

BT - Optical Micro- and Nanometrology

PB - .

T2 - Optical Micro- and Nanometrology

Y2 - 14 April 2014 through 17 April 2014

ER -