Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Steffen Holland*, Simon Rauchel, Guido Notermans, Yang Xu, Li Shen, Daryl Beetner, David Pommerenke

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

Original languageEnglish
Title of host publicationElectrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings
PublisherESD Association
ISBN (Electronic)9781585373406
Publication statusPublished - 2022
Event44th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2022 - Reno, United States
Duration: 18 Sep 202223 Sep 2022

Conference

Conference44th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/TerritoryUnited States
CityReno
Period18/09/2223/09/22

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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