Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

H. - J. Brandt, Roland Resel, J. Keckes, B. Koppelhuber-Bitschnau, N. Koch, Günther Leising

Research output: Contribution to journalArticleResearch

Original languageEnglish
Pages (from-to)161-166
JournalMaterials Research Society Symposium Proceedings
Volume561
Publication statusPublished - 1999

Treatment code (Nähere Zuordnung)

  • Experimental

Cite this

Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis. / Brandt, H. - J.; Resel, Roland; Keckes, J.; Koppelhuber-Bitschnau, B.; Koch, N.; Leising, Günther.

In: Materials Research Society Symposium Proceedings, Vol. 561, 1999, p. 161-166.

Research output: Contribution to journalArticleResearch

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volume = "561",
pages = "161--166",
journal = "Materials Research Society Symposium Proceedings",
issn = "0272-9172",
publisher = "Materials Research Society",

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TY - JOUR

T1 - Determination of crystallite size and lattice strain in hexaphenyl thin films by line profile analysis

AU - Brandt, H. - J.

AU - Resel, Roland

AU - Keckes, J.

AU - Koppelhuber-Bitschnau, B.

AU - Koch, N.

AU - Leising, Günther

PY - 1999

Y1 - 1999

M3 - Article

VL - 561

SP - 161

EP - 166

JO - Materials Research Society Symposium Proceedings

JF - Materials Research Society Symposium Proceedings

SN - 0272-9172

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