Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis

Regine Bolter; Gunther Lenz; Gustavo Fernandez-Dominguez; Franz Leberl

Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis

Regine Bolter, Gunther Lenz, Gustavo Fernandez-Dominguez, Franz Leberl

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Computer vision, computer graphics and photogrammetry - a common viewpoint
Place of Publication	Wien
Publisher	Österreichische Computer Gesellschaft
Pages	159-166
Volume	147
ISBN (Print)	3-85403-147-5
Publication status	Published - 2001
Event	Workshop of the Austrian Association for Pattern Recognition - Berchtesgarden, Germany Duration: 7 Jun 2001 → 8 Jun 2001

Publication series

Name	Books@ocg.at
Publisher	Österr. Computer-Ges.

Conference

Conference	Workshop of the Austrian Association for Pattern Recognition
Country/Territory	Germany
City	Berchtesgarden
Period	7/06/01 → 8/06/01

Fields of Expertise

Sonstiges

Access to Document

240 - Detection of Flaws on Melamine Fqced Chipboards, Bolter et al., OeAGM 2001.pdfFinal published version, 550 KB

Cite this

Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. / Bolter, Regine; Lenz, Gunther; Fernandez-Dominguez, Gustavo et al.
Computer vision, computer graphics and photogrammetry - a common viewpoint. Vol. 147 Wien: Österreichische Computer Gesellschaft, 2001. p. 159-166 (Books@ocg.at).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Bolter, R, Lenz, G, Fernandez-Dominguez, G & Leberl, F 2001, Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. in Computer vision, computer graphics and photogrammetry - a common viewpoint. vol. 147, Books@ocg.at, Österreichische Computer Gesellschaft, Wien, pp. 159-166, Workshop of the Austrian Association for Pattern Recognition, Berchtesgarden, Germany, 7/06/01.

@inproceedings{6e47585856394a29aa76b6fecb0abb53,

title = "Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis",

author = "Regine Bolter and Gunther Lenz and Gustavo Fernandez-Dominguez and Franz Leberl",

year = "2001",

language = "English",

isbn = "3-85403-147-5",

volume = "147",

series = "Books@ocg.at",

publisher = "{\"O}sterreichische Computer Gesellschaft",

pages = "159--166",

booktitle = "Computer vision, computer graphics and photogrammetry - a common viewpoint",

note = "Workshop of the Austrian Association for Pattern Recognition ; Conference date: 07-06-2001 Through 08-06-2001",

}

TY - GEN

T1 - Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis

AU - Bolter, Regine

AU - Lenz, Gunther

AU - Fernandez-Dominguez, Gustavo

AU - Leberl, Franz

PY - 2001

Y1 - 2001

UR - http://www.icg.tu-graz.ac.at/~gustavo

M3 - Conference paper

SN - 3-85403-147-5

VL - 147

T3 - Books@ocg.at

SP - 159

EP - 166

BT - Computer vision, computer graphics and photogrammetry - a common viewpoint

PB - Österreichische Computer Gesellschaft

CY - Wien

T2 - Workshop of the Austrian Association for Pattern Recognition

Y2 - 7 June 2001 through 8 June 2001

ER -

Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis

Publication series

Conference

Fields of Expertise

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Cite this