Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis

Regine Bolter, Gunther Lenz, Gustavo Fernandez-Dominguez, Franz Leberl

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationComputer vision, computer graphics and photogrammetry - a common viewpoint
Place of PublicationWien
PublisherÖsterreichische Computer Gesellschaft
Pages159-166
Volume147
ISBN (Print)3-85403-147-5
Publication statusPublished - 2001
EventWorkshop of the Austrian Association for Pattern Recognition - Berchtesgarden, Germany
Duration: 7 Jun 20018 Jun 2001

Publication series

NameBooks@ocg.at
PublisherÖsterr. Computer-Ges.

Conference

ConferenceWorkshop of the Austrian Association for Pattern Recognition
CountryGermany
CityBerchtesgarden
Period7/06/018/06/01

Fields of Expertise

  • Sonstiges

Cite this

Bolter, R., Lenz, G., Fernandez-Dominguez, G., & Leberl, F. (2001). Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. In Computer vision, computer graphics and photogrammetry - a common viewpoint (Vol. 147, pp. 159-166). (Books@ocg.at). Wien: Österreichische Computer Gesellschaft.

Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. / Bolter, Regine; Lenz, Gunther; Fernandez-Dominguez, Gustavo; Leberl, Franz.

Computer vision, computer graphics and photogrammetry - a common viewpoint. Vol. 147 Wien : Österreichische Computer Gesellschaft, 2001. p. 159-166 (Books@ocg.at).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bolter, R, Lenz, G, Fernandez-Dominguez, G & Leberl, F 2001, Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. in Computer vision, computer graphics and photogrammetry - a common viewpoint. vol. 147, Books@ocg.at, Österreichische Computer Gesellschaft, Wien, pp. 159-166, Workshop of the Austrian Association for Pattern Recognition, Berchtesgarden, Germany, 7/06/01.
Bolter R, Lenz G, Fernandez-Dominguez G, Leberl F. Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. In Computer vision, computer graphics and photogrammetry - a common viewpoint. Vol. 147. Wien: Österreichische Computer Gesellschaft. 2001. p. 159-166. (Books@ocg.at).
Bolter, Regine ; Lenz, Gunther ; Fernandez-Dominguez, Gustavo ; Leberl, Franz. / Detection of Flaws on Melamine Faced Chipboards using Wavelet-based Texture Analysis. Computer vision, computer graphics and photogrammetry - a common viewpoint. Vol. 147 Wien : Österreichische Computer Gesellschaft, 2001. pp. 159-166 (Books@ocg.at).
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