Detection of crystel lattice defects in microranges of copper by X-ray interferences

Herwig Horn, Hanns Waltinger, Siegfried Däbritz

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)487-492
Journal Journal of Analytical Atomic Spectrometry
Volume14
Publication statusPublished - 1999

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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