Detection of crystel lattice defects in microranges of copper by X-ray interferences

Herwig Horn, Hanns Waltinger, Siegfried Däbritz

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)487-492
JournalJournal of analytical atomic spectrometry
Volume14
Publication statusPublished - 1999

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Detection of crystel lattice defects in microranges of copper by X-ray interferences. / Horn, Herwig; Waltinger, Hanns; Däbritz, Siegfried.

In: Journal of analytical atomic spectrometry, Vol. 14, 1999, p. 487-492.

Research output: Contribution to journalArticleResearchpeer-review

Horn, Herwig ; Waltinger, Hanns ; Däbritz, Siegfried. / Detection of crystel lattice defects in microranges of copper by X-ray interferences. In: Journal of analytical atomic spectrometry. 1999 ; Vol. 14. pp. 487-492.
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year = "1999",
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journal = "Journal of analytical atomic spectrometry",
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AU - Waltinger, Hanns

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M3 - Article

VL - 14

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JO - Journal of analytical atomic spectrometry

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