Abstract
This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.
Original language | English |
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Pages (from-to) | 49-57 |
Number of pages | 9 |
Journal | ASHRAE Conference-Papers |
Volume | 121 |
Publication status | Published - 1 Jan 2015 |
Externally published | Yes |
Event | 2015 ASHRAE Winter Conference - Chicago, United States Duration: 24 Jan 2015 → 28 Jan 2015 |
ASJC Scopus subject areas
- Building and Construction
- Mechanical Engineering