Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Xu Gao; Atieh Talebzadeh; Mahdi Moradian; Yunan Han; David E. Swenson; David Pommerenke

Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Xu Gao, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, David E. Swenson, David Pommerenke

Research output: Contribution to journal › Conference article › peer-review

Abstract

This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

Original language	English
Pages (from-to)	49-57
Number of pages	9
Journal	ASHRAE Conference-Papers
Volume	121
Publication status	Published - 1 Jan 2015
Externally published	Yes
Event	2015 ASHRAE Winter Conference - Chicago, United States Duration: 24 Jan 2015 → 28 Jan 2015

ASJC Scopus subject areas

Building and Construction
Mechanical Engineering

Cite this

Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality. / Gao, Xu; Talebzadeh, Atieh; Moradian, Mahdi et al.
In: ASHRAE Conference-Papers, Vol. 121, 01.01.2015, p. 49-57.

Research output: Contribution to journal › Conference article › peer-review

@article{18c5326f7a4e4d48be551add706b9095,

title = "Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality",

abstract = "This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.",

author = "Xu Gao and Atieh Talebzadeh and Mahdi Moradian and Yunan Han and Swenson, {David E.} and David Pommerenke",

year = "2015",

month = jan,

day = "1",

language = "English",

volume = "121",

pages = "49--57",

journal = "ASHRAE Conference-Papers",

issn = "2378-2129",

publisher = "American Society of Heating, Refrigerating and Air-Conditioning Engineers",

note = "2015 ASHRAE Winter Conference ; Conference date: 24-01-2015 Through 28-01-2015",

}

TY - JOUR

T1 - Dependence of ESD charge voltage on humidity in data centers

T2 - 2015 ASHRAE Winter Conference

AU - Gao, Xu

AU - Talebzadeh, Atieh

AU - Moradian, Mahdi

AU - Han, Yunan

AU - Swenson, David E.

AU - Pommerenke, David

PY - 2015/1/1

Y1 - 2015/1/1

N2 - This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

AB - This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

UR - http://www.scopus.com/inward/record.url?scp=84938874461&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84938874461

SN - 2378-2129

VL - 121

SP - 49

EP - 57

JO - ASHRAE Conference-Papers

JF - ASHRAE Conference-Papers

Y2 - 24 January 2015 through 28 January 2015

ER -

Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality

Abstract

ASJC Scopus subject areas

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