### Abstract

This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.

Original language | English |
---|---|

Pages (from-to) | 49-57 |

Number of pages | 9 |

Journal | ASHRAE Conference-Papers |

Volume | 121 |

Publication status | Published - 1 Jan 2015 |

Externally published | Yes |

Event | 2015 ASHRAE Winter Conference - Chicago, United States Duration: 24 Jan 2015 → 28 Jan 2015 |

### ASJC Scopus subject areas

- Building and Construction
- Mechanical Engineering

## Fingerprint Dive into the research topics of 'Dependence of ESD charge voltage on humidity in data centers: Part III - Estimation of ESD-related risk in data centers using voltage level extrapolation and Chebyshev's inequality'. Together they form a unique fingerprint.

## Cite this

*ASHRAE Conference-Papers*,

*121*, 49-57.