Defect investigations via positron annihilation spectroscopy on proton implanted silicon

Andreas Jörg Schriefl, Sokratis Sgouridis, Werner Schustereder, Werner Puff

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)319-324
JournalSolid state phenomena
Volume178-179
DOIs
Publication statusPublished - 2011

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Defect investigations via positron annihilation spectroscopy on proton implanted silicon. / Schriefl, Andreas Jörg; Sgouridis, Sokratis; Schustereder, Werner; Puff, Werner.

In: Solid state phenomena, Vol. 178-179, 2011, p. 319-324.

Research output: Contribution to journalArticleResearchpeer-review

Schriefl, Andreas Jörg ; Sgouridis, Sokratis ; Schustereder, Werner ; Puff, Werner. / Defect investigations via positron annihilation spectroscopy on proton implanted silicon. In: Solid state phenomena. 2011 ; Vol. 178-179. pp. 319-324.
@article{9e948643d7c84387ace224b1dd35f634,
title = "Defect investigations via positron annihilation spectroscopy on proton implanted silicon",
author = "Schriefl, {Andreas J{\"o}rg} and Sokratis Sgouridis and Werner Schustereder and Werner Puff",
year = "2011",
doi = "10.4028/www.scientific.net/SSP.178-179.319",
language = "English",
volume = "178-179",
pages = "319--324",
journal = "Solid state phenomena",
issn = "1012-0394",
publisher = "Scientific.net",

}

TY - JOUR

T1 - Defect investigations via positron annihilation spectroscopy on proton implanted silicon

AU - Schriefl, Andreas Jörg

AU - Sgouridis, Sokratis

AU - Schustereder, Werner

AU - Puff, Werner

PY - 2011

Y1 - 2011

U2 - 10.4028/www.scientific.net/SSP.178-179.319

DO - 10.4028/www.scientific.net/SSP.178-179.319

M3 - Article

VL - 178-179

SP - 319

EP - 324

JO - Solid state phenomena

JF - Solid state phenomena

SN - 1012-0394

ER -