| Original language | English |
|---|---|
| Specialist publication | IEEE Transactions on Pattern Analysis and Machine Intelligence |
| Publication status | E-pub ahead of print - 2018 |
Cite this
Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly. / Opitz, Michael; Waltner, Georg; Possegger, Horst; Bischof, Horst.
In: IEEE Transactions on Pattern Analysis and Machine Intelligence, 2018.Research output: Contribution to specialist publication › Article › Research › peer-review
@misc{ce10001a3823401b8dc1045a68f85d07,
title = "Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly",
author = "Michael Opitz and Georg Waltner and Horst Possegger and Horst Bischof",
year = "2018",
language = "English",
journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",
issn = "0162-8828",
publisher = "IEEE Computer Society",
}
TY - GEN
T1 - Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly
AU - Opitz, Michael
AU - Waltner, Georg
AU - Possegger, Horst
AU - Bischof, Horst
PY - 2018
Y1 - 2018
M3 - Article
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
SN - 0162-8828
ER -