Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly

Research output: Contribution to specialist publication › Article

Original language	English
Specialist publication	IEEE Transactions on Pattern Analysis and Machine Intelligence
Publication status	E-pub ahead of print - 2018

Cite this

@misc{ce10001a3823401b8dc1045a68f85d07,

title = "Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly",

author = "Michael Opitz and Georg Waltner and Horst Possegger and Horst Bischof",

year = "2018",

language = "English",

journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",

issn = "0162-8828",

publisher = "IEEE Computer Society",

}