Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly

Research output: Contribution to specialist publicationArticleResearchpeer-review

Original languageEnglish
Specialist publicationIEEE Transactions on Pattern Analysis and Machine Intelligence
Publication statusE-pub ahead of print - 2018

Cite this

@misc{ce10001a3823401b8dc1045a68f85d07,
title = "Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly",
author = "Michael Opitz and Georg Waltner and Horst Possegger and Horst Bischof",
year = "2018",
language = "English",
journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",
issn = "0162-8828",
publisher = "IEEE Computer Society",

}

TY - GEN

T1 - Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly

AU - Opitz, Michael

AU - Waltner, Georg

AU - Possegger, Horst

AU - Bischof, Horst

PY - 2018

Y1 - 2018

M3 - Article

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

SN - 0162-8828

ER -