Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging

Franz Pernkopf, Friedrich Pernkopf, Paul O'Leary

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publicationIS&T/SPIE's 14th Annual Symposium on Electronic Imaging
Publisher.
Pages170-181
StatusPublished - 2002

Cite this

Pernkopf, F., Pernkopf, F., & O'Leary, P. (2002). Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging. In IS&T/SPIE's 14th Annual Symposium on Electronic Imaging (pp. 170-181). ..

Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging. / Pernkopf, Franz; Pernkopf, Friedrich; O'Leary, Paul.

IS&T/SPIE's 14th Annual Symposium on Electronic Imaging. ., 2002. p. 170-181.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Pernkopf, F, Pernkopf, F & O'Leary, P 2002, Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging. in IS&T/SPIE's 14th Annual Symposium on Electronic Imaging. ., pp. 170-181.
Pernkopf F, Pernkopf F, O'Leary P. Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging. In IS&T/SPIE's 14th Annual Symposium on Electronic Imaging. . 2002. p. 170-181
Pernkopf, Franz ; Pernkopf, Friedrich ; O'Leary, Paul. / Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging. IS&T/SPIE's 14th Annual Symposium on Electronic Imaging. ., 2002. pp. 170-181
@inproceedings{27ae50e3125547f78880a29cbb66281f,
title = "Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging",
author = "Franz Pernkopf and Friedrich Pernkopf and Paul O'Leary",
year = "2002",
language = "English",
pages = "170--181",
booktitle = "IS&T/SPIE's 14th Annual Symposium on Electronic Imaging",
publisher = ".",

}

TY - GEN

T1 - Dedection fo Surface Defects on Raw Milled Steel Blocks Using Range Imaging

AU - Pernkopf, Franz

AU - Pernkopf, Friedrich

AU - O'Leary, Paul

PY - 2002

Y1 - 2002

M3 - Conference contribution

SP - 170

EP - 181

BT - IS&T/SPIE's 14th Annual Symposium on Electronic Imaging

PB - .

ER -