### Abstract

Original language | English |
---|---|

Title of host publication | Maximum Entropy and Bayesian Methods |

Editors | Gary J. Erickson, Joshua T. Rychert, C. Ray Smith |

Publisher | Springer Netherlands |

Pages | 147-152 |

Number of pages | 6 |

ISBN (Print) | 978-94-010-6111-7 978-94-011-5028-6 |

Publication status | Published - 1998 |

### Publication series

Name | Fundamental Theories of Physics |
---|---|

Publisher | Springer Netherlands |

### Fingerprint

### Keywords

- Apparatus Function, Artificial Intelligence (incl. Robotics), Coding and Information Theory, Deconvolution, Discrete Mathematics in Computer Science, Image Processing, Inverse Problem, Likelihood, Probability Theory and Stochastic Processes, Statistics, general

### Cite this

*Maximum Entropy and Bayesian Methods*(pp. 147-152). (Fundamental Theories of Physics). Springer Netherlands.

**Deconvolution Based on Experimentally Determined Apparatus Functions.** / Dose, V.; Fischer, R.; Linden, W. von der.

Research output: Chapter in Book/Report/Conference proceeding › Other chapter contribution › Research › peer-review

*Maximum Entropy and Bayesian Methods.*Fundamental Theories of Physics, Springer Netherlands, pp. 147-152.

}

TY - CHAP

T1 - Deconvolution Based on Experimentally Determined Apparatus Functions

AU - Dose, V.

AU - Fischer, R.

AU - Linden, W. von der

N1 - DOI: 10.1007/978-94-011-5028-612

PY - 1998

Y1 - 1998

N2 - Deconvolution of experimental measurements in e.g. electron or ion scattering can result in considerable resolution enhancement. It is usually assumed that the apparatus function which we wish to remove from the experimental signal is either known exactly or with a much higher precision than the signal. This assumption is not valid in general. In fact many situations are conceivable where measurement of the apparatus function requires the same effort as measurement of the signal. We have performed a rigorous Bayesian analysis for this general case and present applications to Rutherford backscattering from thin films.

AB - Deconvolution of experimental measurements in e.g. electron or ion scattering can result in considerable resolution enhancement. It is usually assumed that the apparatus function which we wish to remove from the experimental signal is either known exactly or with a much higher precision than the signal. This assumption is not valid in general. In fact many situations are conceivable where measurement of the apparatus function requires the same effort as measurement of the signal. We have performed a rigorous Bayesian analysis for this general case and present applications to Rutherford backscattering from thin films.

KW - Apparatus Function, Artificial Intelligence (incl. Robotics), Coding and Information Theory, Deconvolution, Discrete Mathematics in Computer Science, Image Processing, Inverse Problem, Likelihood, Probability Theory and Stochastic Processes, Statistics, g

M3 - Other chapter contribution

SN - 978-94-010-6111-7 978-94-011-5028-6

T3 - Fundamental Theories of Physics

SP - 147

EP - 152

BT - Maximum Entropy and Bayesian Methods

A2 - Erickson, Gary J.

A2 - Rychert, Joshua T.

A2 - Smith, C. Ray

PB - Springer Netherlands

ER -