Crystallographic and morphological characterization of thin pentacene films on polycrystalline copper surfaces

Martin Oehzelt, Roland Resel, C. Suess, C. Friedlein, W. R. Salaneck

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)054711/1-054711/6
JournalThe journal of chemical physics
Volume124
Issue number5
Publication statusPublished - 2006

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Crystallographic and morphological characterization of thin pentacene films on polycrystalline copper surfaces. / Oehzelt, Martin; Resel, Roland; Suess, C.; Friedlein, C.; Salaneck, W. R.

In: The journal of chemical physics, Vol. 124, No. 5, 2006, p. 054711/1-054711/6.

Research output: Contribution to journalArticleResearchpeer-review

Oehzelt, Martin ; Resel, Roland ; Suess, C. ; Friedlein, C. ; Salaneck, W. R. / Crystallographic and morphological characterization of thin pentacene films on polycrystalline copper surfaces. In: The journal of chemical physics. 2006 ; Vol. 124, No. 5. pp. 054711/1-054711/6.
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AU - Salaneck, W. R.

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