Correlative RamanSEM EDX analysis of corroded components: In particular microbiologically induced corrosion (MIC) of steel and chlorid corrosion of concrete

Thomas Planko, Harald Matthias Fitzek, Stefanie Eichinger, Johannes Rattenberger, Günther Koraimann, H. Zeitlhofer, M. Peyerl, Hartmuth Schröttner

Research output: Contribution to conferencePoster

Abstract

Direct costs due to corrosion worldwide amount to 3 and in some countries up to 5 of the GDP (gross domestic product) 1 2 Microbiologically influenced corrosion (is responsible for 20 of all corrosion damage 3 In this context there is great interest in understanding MIC especially since it has been shown that some microbes slowdown the rate of corrosion 4 while others speed it up 5 Correlative microscopy can bring new insights hereAnothercostly problem we can study with correlative microscopy is the neutralization of the passivation of concrete in reinforced concrete structures caused by road salt Theroad salt NaCl leads to pitting corrosion in the embedded steel through various transport mechanisms in the concrete These transport mechanisms need to be investigatedand correlative microscopy can bring new insightsCorrelativemicroscopy combines the advantages of different microscopic and spectroscopic measurement methods at the same sample location Electron microscopy (energy dispersive X ray spectroscopy ( Raman spectroscopy, Micro X ray fluorescence spectroscopy µ rfa and infinite focus microscopy ( are used in this work
Original languageEnglish
Publication statusPublished - 21 Apr 2022
Event12th ASEM Workshop: Austrian Society for Electron Microscopy - JKU Linz, Linz, Austria
Duration: 21 Apr 202222 Apr 2022
https://asem.at/events/12th-asem-workshop/

Conference

Conference12th ASEM Workshop
Country/TerritoryAustria
CityLinz
Period21/04/2222/04/22
Internet address

ASJC Scopus subject areas

  • General Materials Science

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this