Correlation between systemlevel robustness and TLP results of ESD devices

Bernd Deutschmann, Filippo Magrini, Y. Cao, M. Mayerhofer

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationInternational Electrostatic Discharge Workshop
Publisher.
Pages---
Publication statusPublished - 2011
EventInternational Electrostatic Discharge Workshop - Lake Tahoe, CA, United States
Duration: 16 May 201119 May 2011

Conference

ConferenceInternational Electrostatic Discharge Workshop
Country/TerritoryUnited States
CityLake Tahoe, CA
Period16/05/1119/05/11

Fields of Expertise

  • Sonstiges

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