Correlation between systemlevel robustness and TLP results of ESD devices

Bernd Deutschmann, Filippo Magrini, Y. Cao, M. Mayerhofer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

LanguageEnglish
Title of host publicationInternational Electrostatic Discharge Workshop
Publisher.
Pages---
StatusPublished - 2011
EventInternational Electrostatic Discharge Workshop - Lake Tahoe, CA, United States
Duration: 16 May 201119 May 2011

Conference

ConferenceInternational Electrostatic Discharge Workshop
CountryUnited States
CityLake Tahoe, CA
Period16/05/1119/05/11

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., Magrini, F., Cao, Y., & Mayerhofer, M. (2011). Correlation between systemlevel robustness and TLP results of ESD devices. In International Electrostatic Discharge Workshop (pp. ---). ..

Correlation between systemlevel robustness and TLP results of ESD devices. / Deutschmann, Bernd; Magrini, Filippo; Cao, Y.; Mayerhofer, M.

International Electrostatic Discharge Workshop. ., 2011. p. ---.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Deutschmann, B, Magrini, F, Cao, Y & Mayerhofer, M 2011, Correlation between systemlevel robustness and TLP results of ESD devices. in International Electrostatic Discharge Workshop. ., pp. ---, International Electrostatic Discharge Workshop, Lake Tahoe, CA, United States, 16/05/11.
Deutschmann B, Magrini F, Cao Y, Mayerhofer M. Correlation between systemlevel robustness and TLP results of ESD devices. In International Electrostatic Discharge Workshop. .2011. p. ---.
Deutschmann, Bernd ; Magrini, Filippo ; Cao, Y. ; Mayerhofer, M./ Correlation between systemlevel robustness and TLP results of ESD devices. International Electrostatic Discharge Workshop. ., 2011. pp. ---
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M3 - Conference contribution

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