Correlation between systemlevel robustness and TLP results of ESD devices

Bernd Deutschmann, Filippo Magrini, Y. Cao, M. Mayerhofer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Electrostatic Discharge Workshop
Publisher.
Pages---
Publication statusPublished - 2011
EventInternational Electrostatic Discharge Workshop - Lake Tahoe, CA, United States
Duration: 16 May 201119 May 2011

Conference

ConferenceInternational Electrostatic Discharge Workshop
CountryUnited States
CityLake Tahoe, CA
Period16/05/1119/05/11

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., Magrini, F., Cao, Y., & Mayerhofer, M. (2011). Correlation between systemlevel robustness and TLP results of ESD devices. In International Electrostatic Discharge Workshop (pp. ---). ..