Coordinate measurement with nano-metric resolution from multiple SEM images

Reinhard Danzl, Hartmuth Schröttner, Stefan Scherer, Franz Helmli

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2012
EventEuropean Microscopy Congress - Manchester
Duration: 16 Sep 201221 Sep 2012

Conference

ConferenceEuropean Microscopy Congress
CityManchester
Period16/09/1221/09/12

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Application
  • Theoretical
  • Experimental

Cite this

Danzl, R., Schröttner, H., Scherer, S., & Helmli, F. (2012). Coordinate measurement with nano-metric resolution from multiple SEM images. Poster session presented at European Microscopy Congress, Manchester, .