Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging

Thomas Haber, Christoph Auner, Ursula Palfinger, T. Rothländer, Werner Grogger

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMultinational Congress on Microscopy
Publisher.
Pages663-664
Publication statusPublished - 2011
EventMultinational Congress on Microscopy - Graz, Austria
Duration: 30 Aug 20094 Sep 2009

Conference

ConferenceMultinational Congress on Microscopy
CountryAustria
CityGraz
Period30/08/094/09/09

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Haber, T., Auner, C., Palfinger, U., Rothländer, T., & Grogger, W. (2011). Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging. In Multinational Congress on Microscopy (pp. 663-664). ..

Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging. / Haber, Thomas; Auner, Christoph; Palfinger, Ursula; Rothländer, T.; Grogger, Werner.

Multinational Congress on Microscopy. ., 2011. p. 663-664.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Haber, T, Auner, C, Palfinger, U, Rothländer, T & Grogger, W 2011, Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging. in Multinational Congress on Microscopy. ., pp. 663-664, Multinational Congress on Microscopy, Graz, Austria, 30/08/09.
Haber T, Auner C, Palfinger U, Rothländer T, Grogger W. Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging. In Multinational Congress on Microscopy. . 2011. p. 663-664
Haber, Thomas ; Auner, Christoph ; Palfinger, Ursula ; Rothländer, T. ; Grogger, Werner. / Contrasting Polymers used in Organic Electronic Device Fabrication by STEM EELS and EFTEM spectrum imaging. Multinational Congress on Microscopy. ., 2011. pp. 663-664
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