Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging

Gerald Kothleitner, J.A. Hunt, R. Harmon

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy and Microanalysis
Place of PublicationNew York, NY
PublisherSpringer
Pages616-617
Volume5, Suppl. 2
Publication statusPublished - 1999
EventMicroscopy and Microanalysis - Portland, Or., United States
Duration: 1 Aug 19995 Aug 1999

Publication series

NameMicrososcopy and microanalysis
PublisherSpringer

Conference

ConferenceMicroscopy and Microanalysis
CountryUnited States
CityPortland, Or.
Period1/08/995/08/99

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Kothleitner, G., Hunt, J. A., & Harmon, R. (1999). Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging. In Microscopy and Microanalysis (Vol. 5, Suppl. 2, pp. 616-617). (Micrososcopy and microanalysis). New York, NY: Springer.

Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging. / Kothleitner, Gerald; Hunt, J.A.; Harmon, R.

Microscopy and Microanalysis. Vol. 5, Suppl. 2 New York, NY : Springer, 1999. p. 616-617 (Micrososcopy and microanalysis).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Kothleitner, G, Hunt, JA & Harmon, R 1999, Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging. in Microscopy and Microanalysis. vol. 5, Suppl. 2, Micrososcopy and microanalysis, Springer, New York, NY, pp. 616-617, Microscopy and Microanalysis, Portland, Or., United States, 1/08/99.
Kothleitner G, Hunt JA, Harmon R. Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging. In Microscopy and Microanalysis. Vol. 5, Suppl. 2. New York, NY: Springer. 1999. p. 616-617. (Micrososcopy and microanalysis).
Kothleitner, Gerald ; Hunt, J.A. ; Harmon, R. / Comparsion of STEM EELS Spectrum Imaging VS EFTEM Spectrum Imaging. Microscopy and Microanalysis. Vol. 5, Suppl. 2 New York, NY : Springer, 1999. pp. 616-617 (Micrososcopy and microanalysis).
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