Comparsion of 3D Surface reconstruction data obtained by conventional SEM, ESEM and an Infinite Focus Microscope(IFM)

Hartmuth Schröttner, Mario Schmied, Stefan Scherer

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Original languageEnglish
Title of host publicationModern Developments and Applications in Microbeam Analysis
Publisher.
Pages341-341
Publication statusPublished - 2005
EventEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Florence, Italy
Duration: 22 May 200526 May 2005

Conference

ConferenceEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
Country/TerritoryItaly
CityFlorence
Period22/05/0526/05/05

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