Comparison of Measurement Results and Simulations Based on Finite Element Method for an Electrical Capacitance Tomography System

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationISA/IEEE Sensors for Industry Conference
    Publisher.
    Pages109-115
    ISBN (Print)0-7803-8143-2
    Publication statusPublished - 2004
    EventISA/IEEE Sensors for Industry Conference - New Orleans, United States
    Duration: 27 Jan 200429 Jan 2004

    Conference

    ConferenceISA/IEEE Sensors for Industry Conference
    CountryUnited States
    CityNew Orleans
    Period27/01/0429/01/04

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