Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Stefan Muellegger, Christian suess, Franz Wenzel, Georg Jakopic, Markus Wuchse, Norbert Koch, Anja Haase, K Lamprecht, M Schatzmayer, M Mitterbauer, F Hofer, Günther Leising

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)473-479
JournalSurface Science
Volume507-510
Publication statusPublished - 2002

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