Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Stefan Muellegger, Christian suess, Franz Wenzel, Georg Jakopic, Markus Wuchse, Norbert Koch, Anja Haase, K Lamprecht, M Schatzmayer, M Mitterbauer, F Hofer, Günther Leising

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)473-479
JournalSurface science
Volume507-510
Publication statusPublished - 2002

Cite this

Muellegger, S., suess, C., Wenzel, F., Jakopic, G., Wuchse, M., Koch, N., ... Leising, G. (2002). Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes. Surface science, 507-510, 473-479.