Original language | English |
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Pages (from-to) | 473-479 |
Journal | Surface Science |
Volume | 507-510 |
DOIs | |
Publication status | Published - 2002 |
Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes
Stefan Muellegger, Franz Wenzel, Georg Jakopic, Markus Wuchse, Norbert Koch, Anja Haase, K Lamprecht, M Mitterbauer, F Hofer, Christian Suess, Günther Leising, M. Schatzmayr
Research output: Contribution to journal › Article › peer-review