Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

Stefan Muellegger, Christian suess, Franz Wenzel, Georg Jakopic, Markus Wuchse, Norbert Koch, Anja Haase, K Lamprecht, M Schatzmayer, M Mitterbauer, F Hofer, Günther Leising

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)473-479
JournalSurface science
Volume507-510
Publication statusPublished - 2002

Cite this

Muellegger, S., suess, C., Wenzel, F., Jakopic, G., Wuchse, M., Koch, N., ... Leising, G. (2002). Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes. Surface science, 507-510, 473-479.

Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes. / Muellegger, Stefan; suess, Christian; Wenzel, Franz; Jakopic, Georg; Wuchse, Markus; Koch, Norbert; Haase, Anja; Lamprecht, K; Schatzmayer, M; Mitterbauer, M; Hofer, F; Leising, Günther.

In: Surface science, Vol. 507-510, 2002, p. 473-479.

Research output: Contribution to journalArticleResearchpeer-review

Muellegger, S, suess, C, Wenzel, F, Jakopic, G, Wuchse, M, Koch, N, Haase, A, Lamprecht, K, Schatzmayer, M, Mitterbauer, M, Hofer, F & Leising, G 2002, 'Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes' Surface science, vol. 507-510, pp. 473-479.
Muellegger S, suess C, Wenzel F, Jakopic G, Wuchse M, Koch N et al. Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes. Surface science. 2002;507-510:473-479.
Muellegger, Stefan ; suess, Christian ; Wenzel, Franz ; Jakopic, Georg ; Wuchse, Markus ; Koch, Norbert ; Haase, Anja ; Lamprecht, K ; Schatzmayer, M ; Mitterbauer, M ; Hofer, F ; Leising, Günther. / Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes. In: Surface science. 2002 ; Vol. 507-510. pp. 473-479.
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author = "Stefan Muellegger and Christian suess and Franz Wenzel and Georg Jakopic and Markus Wuchse and Norbert Koch and Anja Haase and K Lamprecht and M Schatzmayer and M Mitterbauer and F Hofer and G{\"u}nther Leising",
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T1 - Combined XPS, AFM, TEM and ellipsometric studies on nanoscale layers in organic light emitting diodes

AU - Muellegger, Stefan

AU - suess, Christian

AU - Wenzel, Franz

AU - Jakopic, Georg

AU - Wuchse, Markus

AU - Koch, Norbert

AU - Haase, Anja

AU - Lamprecht, K

AU - Schatzmayer, M

AU - Mitterbauer, M

AU - Hofer, F

AU - Leising, Günther

PY - 2002

Y1 - 2002

M3 - Article

VL - 507-510

SP - 473

EP - 479

JO - Surface science

JF - Surface science

SN - 0039-6028

ER -