Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy for Global Challenges
Publisher.
PagesIT-4-P3166
Publication statusPublished - 2014
EventInternational Microscopy Congress 2014 - Prag Tschechische Republik
Duration: 7 Sep 201412 Sep 2014

Conference

ConferenceInternational Microscopy Congress 2014
CityPrag Tschechische Republik
Period7/09/1412/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. / Mitsche, Stefan; Pölt, Peter.

Microscopy for Global Challenges. ., 2014. p. IT-4-P3166.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Mitsche, S & Pölt, P 2014, Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope. in Microscopy for Global Challenges. ., pp. IT-4-P3166, International Microscopy Congress 2014, Prag Tschechische Republik, 7/09/14.
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AU - Pölt, Peter

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BT - Microscopy for Global Challenges

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