Combined EDS and WDS analysis of thin specimens with high spatial and energy resolution in the scanning electron microscope

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationMicroscopy for Global Challenges
Publisher.
PagesIT-4-P3166
Publication statusPublished - 2014
EventInternational Microscopy Congress 2014 - Prag Tschechische Republik
Duration: 7 Sep 201412 Sep 2014

Conference

ConferenceInternational Microscopy Congress 2014
CityPrag Tschechische Republik
Period7/09/1412/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

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