Cluster Correspondence Views for Enhanced Analysis of SOM Displays

Jürgen Bernard, Tatiana von Landesberger, Sebastian Bremm, Tobias Schreck

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication2010 IEEE Symposium on Visual Analytics Science and Technology
Place of PublicationPiscataway, NJ
PublisherInstitute of Electrical and Electronics Engineers
Pages217-218
ISBN (Print)978-1-4244-9486-6
DOIs
Publication statusPublished - 2010

Fields of Expertise

  • Sonstiges

Cite this

Bernard, J., von Landesberger, T., Bremm, S., & Schreck, T. (2010). Cluster Correspondence Views for Enhanced Analysis of SOM Displays. In 2010 IEEE Symposium on Visual Analytics Science and Technology (pp. 217-218). Piscataway, NJ: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/VAST.2010.5651676

Cluster Correspondence Views for Enhanced Analysis of SOM Displays. / Bernard, Jürgen; von Landesberger, Tatiana; Bremm, Sebastian; Schreck, Tobias.

2010 IEEE Symposium on Visual Analytics Science and Technology. Piscataway, NJ : Institute of Electrical and Electronics Engineers, 2010. p. 217-218.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Bernard, J, von Landesberger, T, Bremm, S & Schreck, T 2010, Cluster Correspondence Views for Enhanced Analysis of SOM Displays. in 2010 IEEE Symposium on Visual Analytics Science and Technology. Institute of Electrical and Electronics Engineers, Piscataway, NJ, pp. 217-218. https://doi.org/10.1109/VAST.2010.5651676
Bernard J, von Landesberger T, Bremm S, Schreck T. Cluster Correspondence Views for Enhanced Analysis of SOM Displays. In 2010 IEEE Symposium on Visual Analytics Science and Technology. Piscataway, NJ: Institute of Electrical and Electronics Engineers. 2010. p. 217-218 https://doi.org/10.1109/VAST.2010.5651676
Bernard, Jürgen ; von Landesberger, Tatiana ; Bremm, Sebastian ; Schreck, Tobias. / Cluster Correspondence Views for Enhanced Analysis of SOM Displays. 2010 IEEE Symposium on Visual Analytics Science and Technology. Piscataway, NJ : Institute of Electrical and Electronics Engineers, 2010. pp. 217-218
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