Charge spectrometry with a strongly coupled superconducting single-electron transistor

C. P. Heij, P. Hadley, J. E. Mooij

Research output: Contribution to journalArticleResearchpeer-review

Abstract

We have used a superconducting single-electron transistor as a dc electrometer that is strongly coupled to the metal island of another transistor. With this setup, it is possible to directly measure the charge distribution on this island. The strong capacitive coupling was achieved by a multilayer fabrication technique that allowed us to make the coupling capacitance bigger than the junction capacitances. Simulations of this system were done using the orthodox theory of single-electron tunneling and showed excellent agreement with the measurements.

Original languageEnglish
Article number245116
Pages (from-to)2451161-2451165
Number of pages5
JournalPhysical Review / B
Volume64
Issue number24
Publication statusPublished - 15 Dec 2001
Externally publishedYes

Fingerprint

Single electron transistors
single electron transistors
Spectrometry
Capacitance
capacitance
Electrometers
electrometers
Electron tunneling
Charge distribution
electron tunneling
charge distribution
spectroscopy
Multilayers
Transistors
transistors
Metals
Fabrication
fabrication
metals
simulation

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Charge spectrometry with a strongly coupled superconducting single-electron transistor. / Heij, C. P.; Hadley, P.; Mooij, J. E.

In: Physical Review / B, Vol. 64, No. 24, 245116, 15.12.2001, p. 2451161-2451165.

Research output: Contribution to journalArticleResearchpeer-review

Heij, C. P. ; Hadley, P. ; Mooij, J. E. / Charge spectrometry with a strongly coupled superconducting single-electron transistor. In: Physical Review / B. 2001 ; Vol. 64, No. 24. pp. 2451161-2451165.
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