Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances

Bernd Deutschmann, G. Langer, G. Auderer

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher	.
Pages	150-153
Publication status	Published - 2004
Event	International Workshop on Electromagnetic Compatibility of Integrated Circuits - Angers, France Duration: 31 Mar 2004 → 1 Apr 2004

Conference	International Workshop on Electromagnetic Compatibility of Integrated Circuits
Country/Territory	France
City	Angers
Period	31/03/04 → 1/04/04

Fields of Expertise

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title = "Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances",

author = "Bernd Deutschmann and G. Langer and G. Auderer",

year = "2004",

language = "English",

pages = "150--153",

booktitle = "International Workshop on Electromagnetic Compatibility of Integrated Circuits",

publisher = ".",

note = "International Workshop on Electromagnetic Compatibility of Integrated Circuits ; Conference date: 31-03-2004 Through 01-04-2004",

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TY - GEN

T1 - Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances

AU - Deutschmann, Bernd

AU - Langer, G.

AU - Auderer, G.

PY - 2004

Y1 - 2004

M3 - Conference paper

SP - 150

EP - 153

BT - International Workshop on Electromagnetic Compatibility of Integrated Circuits

PB - .

T2 - International Workshop on Electromagnetic Compatibility of Integrated Circuits

Y2 - 31 March 2004 through 1 April 2004

ER -