Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances

Bernd Deutschmann, G. Langer, G. Auderer

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages150-153
Publication statusPublished - 2004
EventInternational Workshop on Electromagnetic Compatibility of Integrated Circuits - Angers, France
Duration: 31 Mar 20041 Apr 2004

Conference

ConferenceInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
CountryFrance
CityAngers
Period31/03/041/04/04

Fields of Expertise

  • Sonstiges

Cite this

Deutschmann, B., Langer, G., & Auderer, G. (2004). Characterizing the Immunity of Integrated Circuits against Electrical Fast Transient Disturbances. In International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 150-153). ..