Characterization of the Radiated Electromagnetic Emission of Clock Trees

T. Ostermann, B. Lackner, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages188-193
Publication statusPublished - 2004
EventInternational Workshop on Electromagnetic Compatibility of Integrated Circuits - Angers, France
Duration: 31 Mar 2004 → 1 Apr 2004

Conference

ConferenceInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
CountryFrance
CityAngers
Period31/03/04 → 1/04/04

Fields of Expertise

  • Sonstiges

Cite this

Ostermann, T., Lackner, B., & Deutschmann, B. (2004). Characterization of the Radiated Electromagnetic Emission of Clock Trees. In International Workshop on Electromagnetic Compatibility of Integrated Circuits (pp. 188-193). ..

Characterization of the Radiated Electromagnetic Emission of Clock Trees. / Ostermann, T.; Lackner, B.; Deutschmann, Bernd.

International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., 2004. p. 188-193.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Ostermann, T, Lackner, B & Deutschmann, B 2004, Characterization of the Radiated Electromagnetic Emission of Clock Trees. in International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., pp. 188-193, International Workshop on Electromagnetic Compatibility of Integrated Circuits, Angers, France, 31/03/04.
Ostermann T, Lackner B, Deutschmann B. Characterization of the Radiated Electromagnetic Emission of Clock Trees. In International Workshop on Electromagnetic Compatibility of Integrated Circuits. . 2004. p. 188-193
Ostermann, T. ; Lackner, B. ; Deutschmann, Bernd. / Characterization of the Radiated Electromagnetic Emission of Clock Trees. International Workshop on Electromagnetic Compatibility of Integrated Circuits. ., 2004. pp. 188-193
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