Characterization of the influence of different power supply styles on the electromagnetic emission of ICs by using the TEM-Cell method (IEC 61967-2)

Timm Ostermann, D. Schneider, C. Bacher, Bernd Deutschmann, R. Jungreithmair, W. Gut, C. Lackner, R. Koessl, R. Hagelauer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Workshop on Electromagnetic Compatibility of Integrated Circuits
Publisher.
Pages57-60
Publication statusPublished - 2002

Fields of Expertise

  • Sonstiges

Cite this