Abstract
This paper deals with the characterization of the immunity of integrated circuits (ICs) by means of their susceptibility to conducted radio frequency (RF) electromagnetic interferences (EMI). It describes and analyses a framework to perform such characterization at wafer level, highlighting the benefits that are reaped from it and the problems that can be faced during the test bench setup and the measurement procedure, providing some possible solutions.
Original language | German |
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Title of host publication | 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) |
Publisher | IEEE Publications |
Pages | 196-201 |
Number of pages | 6 |
ISBN (Print) | 978-1-4673-7896-3 |
DOIs | |
Publication status | Published - 13 Nov 2015 |
Event | 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) - Edinburgh, UK Duration: 10 Nov 2015 → 13 Nov 2015 |
Conference
Conference | 2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) |
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Period | 10/11/15 → 13/11/15 |