Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Digest of papers
Publisher	.
Pages	269-274
Publication status	Published - 2003
Event	European Test Workshop - Maastricht, Netherlands Duration: 25 May 2003 → 28 May 2003

Fields of Expertise

@inproceedings{9f80593b89af4ad7890c5bd0d7f9929a,

title = "Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967",

author = "Timm Ostermann and Bernd Deutschmann",

year = "2003",

language = "English",

pages = "269--274",

booktitle = "Digest of papers",

publisher = ".",

note = "European Test Workshop ; Conference date: 25-05-2003 Through 28-05-2003",

}