Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationDigest of papers
Publisher.
Pages269-274
Publication statusPublished - 2003
EventEuropean Test Workshop - Maastricht, Netherlands
Duration: 25 May 200328 May 2003

Conference

ConferenceEuropean Test Workshop
CountryNetherlands
CityMaastricht
Period25/05/0328/05/03

Fields of Expertise

  • Sonstiges

Cite this

Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967. / Ostermann, Timm; Deutschmann, Bernd.

Digest of papers. ., 2003. p. 269-274.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Ostermann, T & Deutschmann, B 2003, Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967. in Digest of papers. ., pp. 269-274, European Test Workshop, Maastricht, Netherlands, 25/05/03.
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