Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationDigest of papers
Publisher.
Pages269-274
Publication statusPublished - 2003
EventEuropean Test Workshop - Maastricht, Netherlands
Duration: 25 May 200328 May 2003

Conference

ConferenceEuropean Test Workshop
CountryNetherlands
CityMaastricht
Period25/05/0328/05/03

Fields of Expertise

  • Sonstiges

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