Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Timm Ostermann, Bernd Deutschmann

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationEuropean Test Workshop
Place of PublicationLos Alamitos, Calif.
PublisherIEEE Computer Soc.
Pages132-137
ISBN (Print)0-7695-1908-3
DOIs
Publication statusPublished - 2003
EventEuropean Test Workshop - Maastricht, Netherlands
Duration: 25 May 200328 May 2003

Conference

ConferenceEuropean Test Workshop
CountryNetherlands
CityMaastricht
Period25/05/0328/05/03

Fields of Expertise

  • Sonstiges

Cite this

Ostermann, T., & Deutschmann, B. (2003). Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967. In European Test Workshop (pp. 132-137). Los Alamitos, Calif.: IEEE Computer Soc.. https://doi.org/10.1109/ETW.2003.1231680