Characterization of step-edge barriers in organic thin-film growth

Gregor Hlawacek, Peter Puschnig, Paul Frank, Adolf Winkler, Claudia Ambrosch-Draxl, Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)108-111
JournalScience
Volume321
DOIs
Publication statusPublished - 2008

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Cite this

Hlawacek, G., Puschnig, P., Frank, P., Winkler, A., Ambrosch-Draxl, C., & Teichert, C. (2008). Characterization of step-edge barriers in organic thin-film growth. Science, 321, 108-111. https://doi.org/10.1126/science.1159455

Characterization of step-edge barriers in organic thin-film growth. / Hlawacek, Gregor; Puschnig, Peter; Frank, Paul; Winkler, Adolf; Ambrosch-Draxl, Claudia; Teichert, Christian.

In: Science, Vol. 321, 2008, p. 108-111.

Research output: Contribution to journalArticleResearchpeer-review

Hlawacek, G, Puschnig, P, Frank, P, Winkler, A, Ambrosch-Draxl, C & Teichert, C 2008, 'Characterization of step-edge barriers in organic thin-film growth' Science, vol. 321, pp. 108-111. https://doi.org/10.1126/science.1159455
Hlawacek G, Puschnig P, Frank P, Winkler A, Ambrosch-Draxl C, Teichert C. Characterization of step-edge barriers in organic thin-film growth. Science. 2008;321:108-111. https://doi.org/10.1126/science.1159455
Hlawacek, Gregor ; Puschnig, Peter ; Frank, Paul ; Winkler, Adolf ; Ambrosch-Draxl, Claudia ; Teichert, Christian. / Characterization of step-edge barriers in organic thin-film growth. In: Science. 2008 ; Vol. 321. pp. 108-111.
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