Characterization of silicon wafer surfaces by FTIR-, XPS-spectroscopy and contact angle measurements

Thomas Bodner, Andreas Behrendt, Emil Prax, Frank Wiesbrock, Franz Stelzer

Research output: Contribution to conferencePoster

Original languageEnglish
Publication statusPublished - 2009
EventEPF'09 - European Polymer Congress: EPF '09 - Graz, Austria
Duration: 12 Jul 200917 Jul 2009

Conference

ConferenceEPF'09 - European Polymer Congress
CountryAustria
CityGraz
Period12/07/0917/07/09

Treatment code (Nähere Zuordnung)

  • Application
  • Theoretical

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