Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy

Alfred Neuhold, Stefanie Fladischer, Markus Neuschitzer, Armin Moser, Ingo Salzmann, Elke Kraker, Bernhard Lamprecht, Werner Grogger, Roland Resel

Research output: Contribution to conference(Old data) Lecture or PresentationResearch

Original languageGerman
Publication statusPublished - 4 Oct 2011
Event8th Autumn School on X-ray Scattering from Surfaces and Thin Layers - Smolenice, Slowakei
Duration: 4 Oct 20117 Oct 2011

Conference

Conference8th Autumn School on X-ray Scattering from Surfaces and Thin Layers
CitySmolenice, Slowakei
Period4/10/117/10/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Cite this

Neuhold, A., Fladischer, S., Neuschitzer, M., Moser, A., Salzmann, I., Kraker, E., ... Resel, R. (2011). Characterization of Organic/Inorganic Interfaces by X-ray Reflectivity and Transmission Electron Microscopy. 8th Autumn School on X-ray Scattering from Surfaces and Thin Layers, Smolenice, Slowakei, .