Characterization of Ni-nanostructures in porous silicon by SEM and TEM - more problems than results

Peter Pölt, Petra Granitzer, Klemens Rumpf, Klemens Jantscher, Mihaela Albu, Stefan Mitsche

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2013
EventEMAS 2013 - Porto, Portugal
Duration: 12 May 201316 May 2013

Conference

ConferenceEMAS 2013
CityPorto, Portugal
Period12/05/1316/05/13

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Characterization of Ni-nanostructures in porous silicon by SEM and TEM - more problems than results. / Pölt, Peter; Granitzer, Petra; Rumpf, Klemens; Jantscher, Klemens; Albu, Mihaela; Mitsche, Stefan.

2013. Poster session presented at EMAS 2013, Porto, Portugal, .

Research output: Contribution to conferencePosterResearch

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title = "Characterization of Ni-nanostructures in porous silicon by SEM and TEM - more problems than results",
author = "Peter P{\"o}lt and Petra Granitzer and Klemens Rumpf and Klemens Jantscher and Mihaela Albu and Stefan Mitsche",
year = "2013",
language = "English",
note = "EMAS 2013 ; Conference date: 12-05-2013 Through 16-05-2013",

}

TY - CONF

T1 - Characterization of Ni-nanostructures in porous silicon by SEM and TEM - more problems than results

AU - Pölt, Peter

AU - Granitzer, Petra

AU - Rumpf, Klemens

AU - Jantscher, Klemens

AU - Albu, Mihaela

AU - Mitsche, Stefan

PY - 2013

Y1 - 2013

M3 - Poster

ER -