Characterization of metal nanostructures trapped in a porousified silicon wafer

Mihaela Albu; Meltem Sezen; Toni Uusimäki; Petra Granitzer; Gerald Kothleitner; Peter Pölt; Klemens Rumpf

Characterization of metal nanostructures trapped in a porousified silicon wafer

Mihaela Albu, Meltem Sezen, Toni Uusimäki, Petra Granitzer, Gerald Kothleitner, Peter Pölt, Klemens Rumpf

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › (Old data) Lecture or Presentation

Original language	English
Publication status	Published - 9 May 2011
Event	European Materials Research Society Spring Meeting 2011: E-MRS Spring Meeting 2011 - Nizza, France Duration: 9 May 2011 → 13 May 2011

Conference

Conference	European Materials Research Society Spring Meeting 2011
Abbreviated title	EMRS Spring Meeting 2011
Country/Territory	France
City	Nizza
Period	9/05/11 → 13/05/11
Other	E-MRS Spring & Bilateral Meeting

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

@conference{61d5d3e04e694448885a975a199c22fc,

title = "Characterization of metal nanostructures trapped in a porousified silicon wafer",

author = "Mihaela Albu and Meltem Sezen and Toni Uusim{\"a}ki and Petra Granitzer and Gerald Kothleitner and Peter P{\"o}lt and Klemens Rumpf",

year = "2011",

month = may,

day = "9",

language = "English",

note = "European Materials Research Society Spring Meeting 2011 : E-MRS Spring Meeting 2011, EMRS Spring Meeting 2011 ; Conference date: 09-05-2011 Through 13-05-2011",

}

TY - CONF

T1 - Characterization of metal nanostructures trapped in a porousified silicon wafer

AU - Albu, Mihaela

AU - Sezen, Meltem

AU - Uusimäki, Toni

AU - Granitzer, Petra

AU - Kothleitner, Gerald

AU - Pölt, Peter

AU - Rumpf, Klemens

PY - 2011/5/9

Y1 - 2011/5/9

M3 - (Old data) Lecture or Presentation

T2 - European Materials Research Society Spring Meeting 2011

Y2 - 9 May 2011 through 13 May 2011

ER -