Characterization of metal nanostructures trapped in a porousified silicon wafer

Mihaela Albu, Meltem Sezen, Toni Uusimäki, Petra Granitzer, Gerald Kothleitner, Peter Pölt, Klemens Rumpf

Research output: Contribution to conference(Old data) Lecture or Presentation

Original languageEnglish
Publication statusPublished - 9 May 2011
EventE-MRS Spring Meeting 2011 - Nizza, France
Duration: 9 May 201113 May 2011

Conference

ConferenceE-MRS Spring Meeting 2011
CountryFrance
CityNizza
Period9/05/1113/05/11
OtherE-MRS Spring & Bilateral Meeting

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Cite this

Albu, M., Sezen, M., Uusimäki, T., Granitzer, P., Kothleitner, G., Pölt, P., & Rumpf, K. (2011). Characterization of metal nanostructures trapped in a porousified silicon wafer. E-MRS Spring Meeting 2011, Nizza, France.