Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs

Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiß, Andreas Genser, Holger Bock, Josef Haid

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	17th IEEE European Test Symposium (ETS)
Publisher	.
Pages	62-67
ISBN (Print)	978-1-4673-0697-3
Publication status	Published - 2012
Event	17th IEEE European Test Symposium (ETS) - , France Duration: 28 May 2012 → 1 Jun 2012

Conference	17th IEEE European Test Symposium (ETS)
Country	France
Period	28/05/12 → 1/06/12

Fields of Expertise

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AU - Grinschgl, Johannes

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Genser, Andreas

AU - Bock, Holger

AU - Haid, Josef

PY - 2012

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SN - 978-1-4673-0697-3

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