Original language | English |
---|---|
Title of host publication | 17th IEEE European Test Symposium (ETS) |
Publisher | . |
Pages | 62-67 |
ISBN (Print) | 978-1-4673-0697-3 |
Publication status | Published - 2012 |
Event | 17th IEEE European Test Symposium (ETS) - , France Duration: 28 May 2012 → 1 Jun 2012 |
Conference
Conference | 17th IEEE European Test Symposium (ETS) |
---|---|
Country | France |
Period | 28/05/12 → 1/06/12 |
Fields of Expertise
- Information, Communication & Computing
Treatment code (Nähere Zuordnung)
- Application
- Experimental
Cite this
Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs. / Krieg, Armin; Grinschgl, Johannes; Steger, Christian; Weiß, Reinhold; Genser, Andreas; Bock, Holger; Haid, Josef.
17th IEEE European Test Symposium (ETS). ., 2012. p. 62-67.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
}
TY - GEN
T1 - Characterization and Handling of Low-Cost Micro-Architectural Signatures in MPSoCs
AU - Krieg, Armin
AU - Grinschgl, Johannes
AU - Steger, Christian
AU - Weiß, Reinhold
AU - Genser, Andreas
AU - Bock, Holger
AU - Haid, Josef
PY - 2012
Y1 - 2012
M3 - Conference contribution
SN - 978-1-4673-0697-3
SP - 62
EP - 67
BT - 17th IEEE European Test Symposium (ETS)
PB - .
ER -