Characterization and compensation of environmental magnetic fields for a monochromatized TEM

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationProceedings EMC / Vol. 1, Instrumentation & Methodology
Publisher.
Pages271-272
Publication statusPublished - 2004
Event13th European Microscopy Congress - Antwerpen / Belgien
Duration: 22 Aug 200427 Aug 2004

Conference

Conference13th European Microscopy Congress
CityAntwerpen / Belgien
Period22/08/0427/08/04

Cite this

Grogger, W., Kothleitner, G., Kraus, B., & Hofer, F. (2004). Characterization and compensation of environmental magnetic fields for a monochromatized TEM. In Proceedings EMC / Vol. 1, Instrumentation & Methodology (pp. 271-272). ..

Characterization and compensation of environmental magnetic fields for a monochromatized TEM. / Grogger, Werner; Kothleitner, Gerald; Kraus, B.; Hofer, Ferdinand.

Proceedings EMC / Vol. 1, Instrumentation & Methodology. ., 2004. p. 271-272.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Grogger, W, Kothleitner, G, Kraus, B & Hofer, F 2004, Characterization and compensation of environmental magnetic fields for a monochromatized TEM. in Proceedings EMC / Vol. 1, Instrumentation & Methodology. ., pp. 271-272, 13th European Microscopy Congress, Antwerpen / Belgien, 22/08/04.
Grogger W, Kothleitner G, Kraus B, Hofer F. Characterization and compensation of environmental magnetic fields for a monochromatized TEM. In Proceedings EMC / Vol. 1, Instrumentation & Methodology. . 2004. p. 271-272
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