Characterising Soft-Failures in Component-Level ESD Testing

Patrick Schrey

Research output: Chapter in Book/Report/Conference proceedingConference paper

Original languageEnglish
Title of host publication2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)
PublisherIEEE Xplore
Pages93-96
Number of pages4
ISBN (Electronic) 978-1-5386-5387-6
DOIs
Publication statusPublished - Jul 2018
Event14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018: PRIME 2018 - Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague Brehova 7, Prague 1, Czech Republic, Prague, Slovakia
Duration: 2 Jul 20185 Jul 2018
Conference number: 14

Conference

Conference14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018
Abbreviated titlePRIME 2018
CountrySlovakia
CityPrague
Period2/07/185/07/18

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